Datasheet | August 6, 2018

High Resolution Beam Profiling Camera With GigE Interface: SP920G Datasheet

Source: Ophir Photonics

The Ophir® SP920G GigE Silicon CCD High Resolution Camera is designed to capture and analyze wavelengths from 190 nm - 110 nm for industrial laser beam profiling applications. With a compact design, wide dynamic range, excellent signal to noise ratio, and a high-speed GigE (Gigabit Ethernet) interface, the camera is ideal for measuring CW and pulsed laser profiles in applications such as laser cutting of medical devices or the welding of dissimilar materials. For additional features and specifications, download the available datasheet.