NanoScan 2s Scanning Slit Beam Profiler

Source: Ophir Photonics

NanoScan™ Scanning Slit Beam Profiler

The NanoScan™ 2s from Ophir Photonics is a scanning slit beam profiler designed to deliver highly accurate dimensional measurements of laser beam spatial irradiance profiles in accordance with the ISO standard 11146. With the options of a silicon, germanium, or pyroelectric detector, this instrument is able to profile lasers of any wavelength from UV to far infrared, out to 100 µm and beyond. This profiler provides instantaneous feedback of beam parameters for CW and kHz pulsed lasers, with measurement update rates to 20 Hz.

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The NanoScan™ profiler uses the scanning slit technique to measure beam sizes ranging from microns to centimeters at beam powers from microwatts to kilowatts, often without attenuation. Beam sizes and beam pointing can be measured with a 2-sigma precision of several hundred nanometers due to the high accuracy and stability of the profiler. With an updated integrated software package for the Microsoft Windows Platform, and a software controllable scan speed. “Peak connect” algorithm measurements of pulsed and pulse width modulated lasers with frequencies of 10 kHz and higher are attainable. The NanoScan™ is capable of simultaneously measuring up to 16 beams, or regions of interest, within the aperture.

For more on the NanoScan™ profiler’s capabilities, benefits, and specifications, download the datasheet.

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