Stress-Screening Reliability Tester For Power Components Qualifies COTS Components
Santa Ana, CA - Intepro Systems recently announced the worldwide availability of the new power semiconductor test system, SEMTest. SEMTest is a configurable stress-screening system able to perform accelerated lifetime testing of power semiconductors and modules incorporating IGBT, MOSFET, SCR, diode and bipolar parts. The system is ideal for both manufacturers and users of power semiconductors who want to qualify commercial off the shelf devices for use in high reliability applications found in automotive, transportation, aerospace, defense, industrial, and medical systems.
The core of SEMTest is a flexible architecture that can be modified to meet each customer's unique test requirements. Standard systems can be configured with from 20 to 1000 test cells, but larger systems are available on special order. Each cell features its own local controller to set and monitor either applied or UUT (unit under test) power and other test parameters. Each cell also has a measurement unit for temperature, current, voltage, and timing making it possible for complete characterization and production tests to accelerate failure mechanisms of individual devices and determine functional operating limits.
Primary capabilities:
- Power cycling for thermal and electrical stressing of devices under test
- Trend monitoring with user defined warning and control limits
- Rapid device temperature cycling & ambient temperature profiling
- Measuring junction temperatures
- Detecting nascent failures and automatically sending alerts
Test configurations are quickly programmed through a user-friendly graphical user interface. Setups and measures for each test cell are displayed on the screen and output into a SQL database for fast in-test and post-test analysis.
SOURCE: Intepro Systems